Choudhary, N., Hadfield, R. and MacLaren, I. (2025) Transmission electron microscopy analysis of atomic layer deposited NbTiN/NbN superconducting thin films. [Data Collection]
Datacite DOI: 10.5525/gla.researchdata.2066
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Collection description
The dataset contains the relevant files of the data which support the research article.
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| College / School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
| Date Deposited: | 28 Oct 2025 16:02 |
| URI: | https://researchdata.gla.ac.uk/id/eprint/2066 |
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