Data Collection

MacLaren, I. , Silinga, A., Barthel, J., Kleibeuker, J., MacManus Driscoll, J., Allen, C. and Kirkland, A. (2025) Atomic resolution imaging of the strength and 3D direction of atomic displacements in functional oxide thin films. [Data Collection]

Paton, K. , Veale, M. C., Mu, X., Allen, C. S., Maneuski, D., Kübel, C., O'Shea, V., Kirkland, A. and McGrouther, D. (2021) Quantifying the performance of a hybrid pixel detector with GaAs:Cr sensor for transmission electron microscopy. [Data Collection] (Unpublished)

MacLaren, I. , Macgregor, T., Allen, C. and Kirkland, A. (2020) Detectors – the ongoing revolution in scanning transmission electron microscopy and why this important to materials characterisation. [Data Collection]