The advent of aberration corrected transmission electron microscopy has led to considerable improvements in the field of high resolution electron microscopy imaging. In this paper we show how these developments are applied to imaging of magnetic structure in field free or low field conditions. Whilst the capability of increased spatial resolution is demonstrated on magnetic layers with a width of *lt; 20nm we also consider how a pixelated detector can be used to dramatically increase the efficiency of the detection of the magnetic signal variation in the presence of strong diffraction contrast.