Oxygen impurities link bistability and magnetoresistance in organic spin valves I Bergenti, F Borgatti, M Calbucci, A Riminucci, R Cecchini, P Graziosi, D MacLaren*, A Giglia, JP Rueff, D Céolin, L Pasquali & V Dediu ACS Applied Materials and Interfaces (doi:10.1021/acsami.7b16068) * Contact E-mail: Donald.MacLaren@glasgow.ac.uk Only electron microscopy data files relating to the publication were collected at the University of Glasgow and are stored here. Raw data files, typically in Gatan's Digital Micrograph file format (details at the time of writing are advertised at: http://www.gatan.com/products/tem-analysis/gatan-microscopy-suite-software). Data were acquired using a JEOL ARMcFEG instrument operated at 200kV, using a Gatan Quantum electron spectrometer for EELS measurements, typically collected using the spectrum imaging methodology (see manuscript for details). Spectrum imaging is performed by first collecting a dark field 'survey image' then acquiring data within a sub-region indicated within the survey image. For the datasets used here, two EELS spectra (low-loss and core loss) and dark field images from two detectors ('Gatan DF' and 'Gatan HAADF') are recorded; the file names generally indicate the nature of each subset of the data. Note that metadata within the DM3 files may not be accurate, particularly user-inputted details of the sample and 'session info.' STEM data are generally collected using a 40 micron condenser aperture with 'spot size 7,8 or 9' JEOL ARM configuration and a camera length of 20mm. (S)TEM and EELS data used to compile figs 3 and S2 are provided here. The data derive from a larger set of scans and images that were used to check for consistency and reproducibility but which are not included here. Figure 3 (a) The TEM image is included in Fig3a.dm3. It was rotated and cropped for publication and the inset Fourier Transforms were calculated using the tool within Digital Micrograph in the regions indicated in the manuscript. (b) The spectrum image files outlined above are all named "Fig3b_xxxx.dm4" where the "xxxx" indicates the type of data. Datasets were processed using standard routines within Digital Micrograph, generally starting with alignment of the zero-loss peak, cropping of low-signal regions of the low-loss dataset then applying Fourier ratio deconvolution. Many of the subtleties to be considered in such processing are outlined in "Accurate measurement of absolute experimental inelastic mean free paths and EELS differential cross-sections," by A J Craven, J Bobynko, B Sala, I MacLaren, Ultramicroscopy 170 (2016) 113-127 and subsequent papers by the same authors. The same data are used in Fig. S2 and further processed, plotting in (c) the normalised signal intensities integrated across bins parallel to the interface and in (d) the Co L2,3 edges at the indicated locations.