Low noise and high photo detection probability SPAD in 180 nm standard CMOS technology

Accarino, C., Al-Rawhani, M., Shash, Y. D., Maneuski, D., Mitra, S., Buttar, C. and Cumming, D. R.S. (2017) Low noise and high photo detection probability SPAD in 180 nm standard CMOS technology. [Data Collection]

Enlighten Publications URI: http://eprints.gla.ac.uk/id/eprint/161512

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Characterization of the designed Single photon avalanche diode (SPAD) performances. The performances are compared to the state-of-the-art to prove the effectiveness of the design at low illumination condition.

College / School: College of Science and Engineering > School of Engineering
Date Deposited: 11 Oct 2017 16:01
Funder's Name: Engineering and Physical Sciences Research Council (EPSRC)
URI: http://researchdata.gla.ac.uk/id/eprint/493

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Accarino, C., Al-Rawhani, M., Shash, Y. D., Maneuski, D., Mitra, S., Buttar, C. and Cumming, D. R.S. (2017); Low noise and high photo detection probability SPAD in 180 nm standard CMOS technology

University of Glasgow

DOI: 10.5525/gla.researchdata.493

Retrieved: 2020-04-07

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