Dynamical torque in CoxFe3-xO4 nano-cube thin films characterized by femtosecond magneto-optics: a pi-shift control of the magnetization precession

Mircea Vomir*, Robin Turnbull, Ipek Birced, Pedro Parreira, Donald A. MacLaren, Stephen Lee, 
Pascal André*, Jean-Yves Bigot*

E-mail: * bigot@ipcms.unistra.fr, vomir@ipcms.unistra.fr, pjpandre@riken.jp

For requests relating to the TEM data stored here: donald.maclaren@glasgow.ac.uk

Raw data TEM files are in Gatan's Digital Micrograph file format (details at the time of writing are advertised at: 
http://www.gatan.com/products/tem-analysis/gatan-microscopy-suite-software). 
Data was acquired using a JEOL ARMcFEG instrument operated at 200kV, using a Gatan Quantum electron spectrometer for EELS measurements (see manuscript for details). Spectrum imaging is performed by first collecting a dark field 'survey image' then acquiring data within a sub-region indicated within the survey image. For the datasets used here, 
two EELS spectra (low-loss and core loss) and dark field images from two detectors ('Gatan DF' and 'Gatan HAADF') are recorded; the file names generally indicate the nature of each subset of the data. See references in the main article for descriptions of the spectrum imaging technique. Note that metadata within the DM3 files may not be accurate, particularly user-inputted details of the sample and 'session info.' Conventional TEM images are generally collected using the 'TEM-S, spot-size 3' JEOL ARM configuration, with a 100 micron condenser aperture. STEM data is generally collected using a 40 micron condenser aperture with 'spot size 8' JEOL ARM configuration and a camera length of 20mm.
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Figure 1a is a TEM image of a single nanoparticle illustrating the presence of carbonaceous material. Inset is a FFT of the nanoparticle image. Fig 1a raw data: "Fig1_sample_0%_carbon.dm3" and "Fig1_sample_0%_carbon_fft.jpg".

Fig 1b is obtained by plotting the normalised elemental quantification across the nanoparticle. 
See "Fig1_Dynamic Map_Co.dm3", "Fig1_Dynamic Map_Fe.dm3", "Fig1_Dynamic Map_O.dm3", "Fig1_Profile Of Dynamic Map_ALL.dm3", "Fig1_Profile Of Dynamic Map_ALL_NORM.dm3" and "Fig1_profile_raw.xlsx".

Fig 1b raw data: "Fig1_EELS Spectrum Image (high-loss).dm3" and "Fig1_EELS Spectrum Image (low-loss).dm3" that were processed using standard routines within Digital micrograph, starting with the use of the low-loss signal to correct for apparent energy drifts within the core loss data. See text and references of the main text for details. A good summary of the processing of spectrum image EELS data is provided in: Spectrum imaging of complex nanostructures using DualEELS: I. digital extraction replicas, J Bobynko, I MacLaren and AJ Craven, Ultramicroscopy 149 (2015) 9-20.

Figures S3a-c shows TEM images of sample with 0% Co with two different magnifications and the correspondent electron diffraction pattern. Intensity in the diffraction pattern is inverted for clarity. 
See: "FigS3a_sample_0%_25kx.dm3", "FigS3b_sample_0%_500kx.dm3" and "FigS3c_sample_0%_dif.dm3".

Figures S3d-f shows TEM images of sample with 10% Co with two different magnifications and the correspondent electron diffraction pattern. Intensity in the diffraction pattern is inverted for clarity. 
See: "FigS3d_sample_10%_50kx.dm3", "FigS3e_sample_10%_500kx.dm3" and "FigS3f_sample_10%_dif.dm3".

Figures S3g-i shows TEM images of sample with 33% Co with two different magnifications and the correspondent electron diffraction pattern. Intensity in the diffraction pattern is inverted for clarity. 
See: "FigS3g_sample_33%_40kx.dm3", "FigS3h_sample_33%_500kx.dm3" and "FigS3i_sample_33%_dif.dm3".

Figure in S4 is a HAADF STEM image of a 20% Co-doped nanoparticle sample, obtained under the standard STEM conditions noted above. Carbon build-up under the intense STEM beam was common in these samples and point-acquisition EELS data was generally collected by manually hopping the beam from particle to particle during acquisition.
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