Nanoscale Mapping of the Magnetic Properties of (111)-Oriented La0.67Sr0.33MnO3 KJ O’Shea, DA MacLaren, D McGrouther, D Schwarzbach, M Jungbauer, S Hušhn, V Moshnyaga and RL Stamps 1 SUPA, School of Physics and Astronomy, University of Glasgow, G12 8QQ, Glasgow, United Kingdom 2 I. Physikalisches Institut, Georg-August-Universitašt Gošttingen, Friedrich-Hund-Platz 1, 37077 Gošttingen, Germany Contact E-mail: Donald.MacLaren@glasgow.ac.uk Raw data files, typically in Gatan's Digital Micrograph file format (details at the time of writing are advertised at: http://www.gatan.com/products/tem-analysis/gatan-microscopy-suite-software). Data was acquired using a JEOL ARMcFEG instrument operated at 200kV, using a Gatan Quantum electron spectrometer for EELS measurements (see manuscript for details). Details of the Lorentz mode operation can be found in the manuscript, supplementary information and associated references. FIGURE 1 -------- Fig1a is a composite of 5 electron micrographs, labelled sequentially (Fig1a_part1.dm3, etc). Calibration and metadata for these images and the inset diffraction pattern are available within the dm3 file format although the veracity of user-inputted data (in comparison to automatically-populated metadata such as the magnification) has not been checked. Fig1b is a schematic available in the manuscript. The data in Fig1c can be replicated using the linescan tool in Digital Micrograph, applied to Fig1d (see below). Fig1d is a Lorentz TEM data set derived from a quadrant detector as detailed in the manuscript. The raw image files collected from each quadrant are enclosed and processed files (see filenames for details) are also included. FIGURE 2 -------- Fig2a.dm3 is a bright field STEM image. Fig2b.dm3 is a HAADF STEM image. Figs2c and 2d derive from a scanning diffraction spectrum image; the datacube is contained with the 'SpectrumImage' file whilst a HAADF image showing the region of data acquisition is indicated in the 'SurveyImage' file. See Gatan product information for details of methodology and analysis. FIGURE 3 -------- Fig. 3 was plotted by calculating the 't/lambda' value using the zero-loss spectra of a Dual EELS spectrum image. Some of the methodology used for processing can be found in Ref. 1, below. The files are: the 'Survey Image' showing the location of data acquisition; the low and high loss EELS spectrum images; and the HAADF signal acquired simultaneously. The high loss signal was used to assign carbon to the bright feature in the final figure. Metadata in the original files specify many of the experimental conditions: alpha = 22 mrad and beta=36mrad. [1] J Bobynko, I MacLaren, AJ Craven, Ultramicroscopy 149 (2015) 9. FIGURE 4 -------- The data used to produce figure 4 are contained within multiple folders, each labelled with the acquisition temperature. The format of each data set follows that of the DPC data described for Fig. 1d. Data used for the graph are enclosed in the excel file 'Bs_plot.xlsx' FIGURE 5 -------- Figures 5a and 5b were calculated using the data of figure 4 and the digital micrograph files are enclosed.